Microstructure+AFM+images

The image below of is of a microstructred standard. The raw line exhibits upward bowing on the right side of the image. This could be due to tip interaction with the surface and poor image flattening. The squares wells (dark) are approximately 4.5 -5.0 microns wide, as estimated from the image.

The 9.4 micron scan is a close-up of the microstructure. The raw line view represents the topology of the top of the image, located at the the right-facing triangle facing in the Plane-TopView. The bottom half of the scan did not have have optimal Z-range, as well, the constrast and brightness need to be improved. The top of the image is much clearer, although it appears that there is slight surface gradiant as see in shadowing.